Contributors: 1
Author Tokens Token Proportion Commits Commit Proportion
Matti Vaittinen 2497 100.00% 1 100.00%
Total 2497 1


// SPDX-License-Identifier: GPL-2.0-only
/* Unit tests for IIO light sensor gain-time-scale helpers
 *
 * Copyright (c) 2023 Matti Vaittinen <mazziesaccount@gmail.com>
 */

#include <kunit/device.h>
#include <kunit/test.h>
#include <linux/device.h>
#include <linux/iio/iio-gts-helper.h>
#include <linux/iio/types.h>

/*
 * Please, read the "rant" from the top of the lib/test_linear_ranges.c if
 * you see a line of helper code which is not being tested.
 *
 * Then, please look at the line which is not being tested. Is this line
 * somehow unusually complex? If answer is "no", then chances are that the
 * "development inertia" caused by adding a test exceeds the benefits.
 *
 * If yes, then adding a test is probably a good idea but please stop for a
 * moment and consider the effort of changing all the tests when code gets
 * refactored. Eventually it neeeds to be.
 */

#define TEST_TSEL_50		1
#define TEST_TSEL_X_MIN		TEST_TSEL_50
#define TEST_TSEL_100		0
#define TEST_TSEL_200		2
#define TEST_TSEL_400		4
#define TEST_TSEL_X_MAX		TEST_TSEL_400

#define TEST_GSEL_1		0x00
#define TEST_GSEL_X_MIN		TEST_GSEL_1
#define TEST_GSEL_4		0x08
#define TEST_GSEL_16		0x0a
#define TEST_GSEL_32		0x0b
#define TEST_GSEL_64		0x0c
#define TEST_GSEL_256		0x18
#define TEST_GSEL_512		0x19
#define TEST_GSEL_1024		0x1a
#define TEST_GSEL_2048		0x1b
#define TEST_GSEL_4096		0x1c
#define TEST_GSEL_X_MAX		TEST_GSEL_4096

#define TEST_SCALE_1X		64
#define TEST_SCALE_MIN_X	TEST_SCALE_1X
#define TEST_SCALE_2X		32
#define TEST_SCALE_4X		16
#define TEST_SCALE_8X		8
#define TEST_SCALE_16X		4
#define TEST_SCALE_32X		2
#define TEST_SCALE_64X		1

#define TEST_SCALE_NANO_128X	500000000
#define TEST_SCALE_NANO_256X	250000000
#define TEST_SCALE_NANO_512X	125000000
#define TEST_SCALE_NANO_1024X	62500000
#define TEST_SCALE_NANO_2048X	31250000
#define TEST_SCALE_NANO_4096X	15625000
#define TEST_SCALE_NANO_4096X2	7812500
#define TEST_SCALE_NANO_4096X4	3906250
#define TEST_SCALE_NANO_4096X8	1953125

#define TEST_SCALE_NANO_MAX_X TEST_SCALE_NANO_4096X8

/*
 * Can't have this allocated from stack because the kunit clean-up will
 * happen only after the test function has already gone
 */
static struct iio_gts gts;

static const struct iio_gain_sel_pair gts_test_gains[] = {
	GAIN_SCALE_GAIN(1, TEST_GSEL_1),
	GAIN_SCALE_GAIN(4, TEST_GSEL_4),
	GAIN_SCALE_GAIN(16, TEST_GSEL_16),
	GAIN_SCALE_GAIN(32, TEST_GSEL_32),
	GAIN_SCALE_GAIN(64, TEST_GSEL_64),
	GAIN_SCALE_GAIN(256, TEST_GSEL_256),
	GAIN_SCALE_GAIN(512, TEST_GSEL_512),
	GAIN_SCALE_GAIN(1024, TEST_GSEL_1024),
	GAIN_SCALE_GAIN(2048, TEST_GSEL_2048),
	GAIN_SCALE_GAIN(4096, TEST_GSEL_4096),
#define HWGAIN_MAX 4096
};

static const struct iio_itime_sel_mul gts_test_itimes[] = {
	GAIN_SCALE_ITIME_US(400 * 1000, TEST_TSEL_400, 8),
	GAIN_SCALE_ITIME_US(200 * 1000, TEST_TSEL_200, 4),
	GAIN_SCALE_ITIME_US(100 * 1000, TEST_TSEL_100, 2),
	GAIN_SCALE_ITIME_US(50 * 1000, TEST_TSEL_50, 1),
#define TIMEGAIN_MAX 8
};
#define TOTAL_GAIN_MAX	(HWGAIN_MAX * TIMEGAIN_MAX)
#define IIO_GTS_TEST_DEV "iio-gts-test-dev"

static struct device *__test_init_iio_gain_scale(struct kunit *test,
		struct iio_gts *gts, const struct iio_gain_sel_pair *g_table,
		int num_g, const struct iio_itime_sel_mul *i_table, int num_i)
{
	struct device *dev;
	int ret;

	dev = kunit_device_register(test, IIO_GTS_TEST_DEV);

	KUNIT_EXPECT_NOT_ERR_OR_NULL(test, dev);
	if (IS_ERR_OR_NULL(dev))
		return NULL;

	ret = devm_iio_init_iio_gts(dev, TEST_SCALE_1X, 0, g_table, num_g,
				    i_table, num_i, gts);
	KUNIT_EXPECT_EQ(test, 0, ret);
	if (ret)
		return NULL;

	return dev;
}

#define test_init_iio_gain_scale(test, gts)	\
	__test_init_iio_gain_scale(test, gts, gts_test_gains, \
				   ARRAY_SIZE(gts_test_gains), gts_test_itimes, \
				   ARRAY_SIZE(gts_test_itimes))

static void test_init_iio_gts_invalid(struct kunit *test)
{
	struct device *dev;
	int ret;
	const struct iio_itime_sel_mul itimes_neg[] = {
		GAIN_SCALE_ITIME_US(-10, TEST_TSEL_400, 8),
		GAIN_SCALE_ITIME_US(200 * 1000, TEST_TSEL_200, 4),
	};
	const struct iio_gain_sel_pair gains_neg[] = {
		GAIN_SCALE_GAIN(1, TEST_GSEL_1),
		GAIN_SCALE_GAIN(2, TEST_GSEL_4),
		GAIN_SCALE_GAIN(-2, TEST_GSEL_16),
	};
	/* 55555 * 38656 = 2147534080 => overflows 32bit int */
	const struct iio_itime_sel_mul itimes_overflow[] = {
		GAIN_SCALE_ITIME_US(400 * 1000, TEST_TSEL_400, 55555),
		GAIN_SCALE_ITIME_US(200 * 1000, TEST_TSEL_200, 4),
	};
	const struct iio_gain_sel_pair gains_overflow[] = {
		GAIN_SCALE_GAIN(1, TEST_GSEL_1),
		GAIN_SCALE_GAIN(2, TEST_GSEL_4),
		GAIN_SCALE_GAIN(38656, TEST_GSEL_16),
	};

	dev = kunit_device_register(test, IIO_GTS_TEST_DEV);
	KUNIT_EXPECT_NOT_ERR_OR_NULL(test, dev);
	if (!dev)
		return;

	/* Ok gains, negative time */
	ret = devm_iio_init_iio_gts(dev, TEST_SCALE_1X, 0, gts_test_gains,
				    ARRAY_SIZE(gts_test_gains), itimes_neg,
				    ARRAY_SIZE(itimes_neg), &gts);
	KUNIT_EXPECT_EQ(test, -EINVAL, ret);

	/* Ok times, negative gain */
	ret = devm_iio_init_iio_gts(dev, TEST_SCALE_1X, 0, gains_neg,
				    ARRAY_SIZE(gains_neg), gts_test_itimes,
				    ARRAY_SIZE(gts_test_itimes), &gts);
	KUNIT_EXPECT_EQ(test, -EINVAL, ret);

	/* gain * time overflow int */
	ret = devm_iio_init_iio_gts(dev, TEST_SCALE_1X, 0, gains_overflow,
				    ARRAY_SIZE(gains_overflow), itimes_overflow,
				    ARRAY_SIZE(itimes_overflow), &gts);
	KUNIT_EXPECT_EQ(test, -EOVERFLOW, ret);
}

static void test_iio_gts_find_gain_for_scale_using_time(struct kunit *test)
{
	struct device *dev;
	int ret, gain_sel;

	dev = test_init_iio_gain_scale(test, &gts);
	if (!dev)
		return;

	ret = iio_gts_find_gain_sel_for_scale_using_time(&gts, TEST_TSEL_100,
						TEST_SCALE_8X, 0, &gain_sel);
	/*
	 * Meas time 100 => gain by time 2x
	 * TEST_SCALE_8X matches total gain 8x
	 * => required HWGAIN 4x
	 */
	KUNIT_EXPECT_EQ(test, 0, ret);
	KUNIT_EXPECT_EQ(test, TEST_GSEL_4, gain_sel);

	ret = iio_gts_find_gain_sel_for_scale_using_time(&gts, TEST_TSEL_200, 0,
						TEST_SCALE_NANO_256X, &gain_sel);
	/*
	 * Meas time 200 => gain by time 4x
	 * TEST_SCALE_256X matches total gain 256x
	 * => required HWGAIN 256/4 => 64x
	 */
	KUNIT_EXPECT_EQ(test, 0, ret);
	KUNIT_EXPECT_EQ(test, TEST_GSEL_64, gain_sel);

	/* Min time, Min gain */
	ret = iio_gts_find_gain_sel_for_scale_using_time(&gts, TEST_TSEL_X_MIN,
						TEST_SCALE_MIN_X, 0, &gain_sel);
	KUNIT_EXPECT_EQ(test, 0, ret);
	KUNIT_EXPECT_EQ(test, TEST_GSEL_1, gain_sel);

	/* Max time, Max gain */
	ret = iio_gts_find_gain_sel_for_scale_using_time(&gts, TEST_TSEL_X_MAX,
					0, TEST_SCALE_NANO_MAX_X, &gain_sel);
	KUNIT_EXPECT_EQ(test, 0, ret);
	KUNIT_EXPECT_EQ(test, TEST_GSEL_4096, gain_sel);

	ret = iio_gts_find_gain_sel_for_scale_using_time(&gts, TEST_TSEL_100, 0,
						TEST_SCALE_NANO_256X, &gain_sel);
	/*
	 * Meas time 100 => gain by time 2x
	 * TEST_SCALE_256X matches total gain 256x
	 * => required HWGAIN 256/2 => 128x (not in gain-table - unsupported)
	 */
	KUNIT_EXPECT_NE(test, 0, ret);

	ret = iio_gts_find_gain_sel_for_scale_using_time(&gts, TEST_TSEL_200, 0,
						TEST_SCALE_NANO_MAX_X, &gain_sel);
	/* We can't reach the max gain with integration time smaller than MAX */
	KUNIT_EXPECT_NE(test, 0, ret);

	ret = iio_gts_find_gain_sel_for_scale_using_time(&gts, TEST_TSEL_50, 0,
						TEST_SCALE_NANO_MAX_X, &gain_sel);
	/* We can't reach the max gain with integration time smaller than MAX */
	KUNIT_EXPECT_NE(test, 0, ret);
}

static void test_iio_gts_find_new_gain_sel_by_old_gain_time(struct kunit *test)
{
	struct device *dev;
	int ret, old_gain, new_gain, old_time_sel, new_time_sel;

	dev = test_init_iio_gain_scale(test, &gts);
	if (!dev)
		return;

	old_gain = 32;
	old_time_sel = TEST_TSEL_200;
	new_time_sel = TEST_TSEL_400;

	ret = iio_gts_find_new_gain_sel_by_old_gain_time(&gts, old_gain,
					old_time_sel, new_time_sel, &new_gain);
	KUNIT_EXPECT_EQ(test, 0, ret);
	/*
	 * Doubling the integration time doubles the total gain - so old
	 * (hw)gain must be divided by two to compensate. => 32 / 2 => 16
	 */
	KUNIT_EXPECT_EQ(test, 16, new_gain);

	old_gain = 4;
	old_time_sel = TEST_TSEL_50;
	new_time_sel = TEST_TSEL_200;
	ret = iio_gts_find_new_gain_sel_by_old_gain_time(&gts, old_gain,
					old_time_sel, new_time_sel, &new_gain);
	KUNIT_EXPECT_EQ(test, 0, ret);
	/*
	 * gain by time 1x => 4x - (hw)gain 4x => 1x
	 */
	KUNIT_EXPECT_EQ(test, 1, new_gain);

	old_gain = 512;
	old_time_sel = TEST_TSEL_400;
	new_time_sel = TEST_TSEL_50;
	ret = iio_gts_find_new_gain_sel_by_old_gain_time(&gts, old_gain,
					old_time_sel, new_time_sel, &new_gain);
	KUNIT_EXPECT_EQ(test, 0, ret);
	/*
	 * gain by time 8x => 1x - (hw)gain 512x => 4096x)
	 */
	KUNIT_EXPECT_EQ(test, 4096, new_gain);

	/* Unsupported gain 2x */
	old_gain = 4;
	old_time_sel = TEST_TSEL_200;
	new_time_sel = TEST_TSEL_400;
	ret = iio_gts_find_new_gain_sel_by_old_gain_time(&gts, old_gain,
					old_time_sel, new_time_sel, &new_gain);
	KUNIT_EXPECT_NE(test, 0, ret);

	/* Too small gain */
	old_gain = 4;
	old_time_sel = TEST_TSEL_50;
	new_time_sel = TEST_TSEL_400;
	ret = iio_gts_find_new_gain_sel_by_old_gain_time(&gts, old_gain,
					old_time_sel, new_time_sel, &new_gain);
	KUNIT_EXPECT_NE(test, 0, ret);

	/* Too big gain */
	old_gain = 1024;
	old_time_sel = TEST_TSEL_400;
	new_time_sel = TEST_TSEL_50;
	ret = iio_gts_find_new_gain_sel_by_old_gain_time(&gts, old_gain,
					old_time_sel, new_time_sel, &new_gain);
	KUNIT_EXPECT_NE(test, 0, ret);

}

static void test_iio_find_closest_gain_low(struct kunit *test)
{
	struct device *dev;
	bool in_range;
	int ret;

	const struct iio_gain_sel_pair gts_test_gains_gain_low[] = {
		GAIN_SCALE_GAIN(4, TEST_GSEL_4),
		GAIN_SCALE_GAIN(16, TEST_GSEL_16),
		GAIN_SCALE_GAIN(32, TEST_GSEL_32),
	};

	dev = test_init_iio_gain_scale(test, &gts);
	if (!dev)
		return;

	ret = iio_find_closest_gain_low(&gts, 2, &in_range);
	KUNIT_EXPECT_EQ(test, 1, ret);
	KUNIT_EXPECT_EQ(test, true, in_range);

	ret = iio_find_closest_gain_low(&gts, 1, &in_range);
	KUNIT_EXPECT_EQ(test, 1, ret);
	KUNIT_EXPECT_EQ(test, true, in_range);

	ret = iio_find_closest_gain_low(&gts, 4095, &in_range);
	KUNIT_EXPECT_EQ(test, 2048, ret);
	KUNIT_EXPECT_EQ(test, true, in_range);

	ret = iio_find_closest_gain_low(&gts, 4097, &in_range);
	KUNIT_EXPECT_EQ(test, 4096, ret);
	KUNIT_EXPECT_EQ(test, false, in_range);

	kunit_device_unregister(test, dev);

	dev = __test_init_iio_gain_scale(test, &gts, gts_test_gains_gain_low,
				ARRAY_SIZE(gts_test_gains_gain_low),
				gts_test_itimes, ARRAY_SIZE(gts_test_itimes));
	if (!dev)
		return;

	ret = iio_find_closest_gain_low(&gts, 3, &in_range);
	KUNIT_EXPECT_EQ(test, -EINVAL, ret);
	KUNIT_EXPECT_EQ(test, false, in_range);
}

static void test_iio_gts_total_gain_to_scale(struct kunit *test)
{
	struct device *dev;
	int ret, scale_int, scale_nano;

	dev = test_init_iio_gain_scale(test, &gts);
	if (!dev)
		return;

	ret = iio_gts_total_gain_to_scale(&gts, 1, &scale_int, &scale_nano);
	KUNIT_EXPECT_EQ(test, 0, ret);
	KUNIT_EXPECT_EQ(test, TEST_SCALE_1X, scale_int);
	KUNIT_EXPECT_EQ(test, 0, scale_nano);

	ret = iio_gts_total_gain_to_scale(&gts, 1, &scale_int, &scale_nano);
	KUNIT_EXPECT_EQ(test, 0, ret);
	KUNIT_EXPECT_EQ(test, TEST_SCALE_1X, scale_int);
	KUNIT_EXPECT_EQ(test, 0, scale_nano);

	ret = iio_gts_total_gain_to_scale(&gts, 4096 * 8, &scale_int,
					  &scale_nano);
	KUNIT_EXPECT_EQ(test, 0, ret);
	KUNIT_EXPECT_EQ(test, 0, scale_int);
	KUNIT_EXPECT_EQ(test, TEST_SCALE_NANO_4096X8, scale_nano);
}

static void test_iio_gts_chk_times(struct kunit *test, const int *vals)
{
	static const int expected[] = {0, 50000, 0, 100000, 0, 200000, 0, 400000};
	int i;

	for (i = 0; i < ARRAY_SIZE(expected); i++)
		KUNIT_EXPECT_EQ(test, expected[i], vals[i]);
}

static void test_iio_gts_chk_scales_all(struct kunit *test, struct iio_gts *gts,
					const int *vals, int len)
{
	static const int gains[] = {1, 2, 4, 8, 16, 32, 64, 128, 256, 512,
				    1024, 2048, 4096, 4096 * 2, 4096 * 4,
				    4096 * 8};
	int expected[ARRAY_SIZE(gains) * 2];
	int i, ret;
	int exp_len = ARRAY_SIZE(gains) * 2;

	KUNIT_EXPECT_EQ(test, exp_len, len);
	if (len != exp_len)
		return;

	for (i = 0; i < ARRAY_SIZE(gains); i++) {
		ret = iio_gts_total_gain_to_scale(gts, gains[i],
						  &expected[2 * i],
						  &expected[2 * i + 1]);
		KUNIT_EXPECT_EQ(test, 0, ret);
		if (ret)
			return;
	}

	for (i = 0; i < ARRAY_SIZE(expected); i++)
		KUNIT_EXPECT_EQ(test, expected[i], vals[i]);
}

static void test_iio_gts_chk_scales_t200(struct kunit *test, struct iio_gts *gts,
					 const int *vals, int len)
{
	/* The gain caused by time 200 is 4x */
	static const int gains[] = {
		1 * 4,
		4 * 4,
		16 * 4,
		32 * 4,
		64 * 4,
		256 * 4,
		512 * 4,
		1024 * 4,
		2048 * 4,
		4096 * 4
	};
	int expected[ARRAY_SIZE(gains) * 2];
	int i, ret;

	KUNIT_EXPECT_EQ(test, 2 * ARRAY_SIZE(gains), len);
	if (len < 2 * ARRAY_SIZE(gains))
		return;

	for (i = 0; i < ARRAY_SIZE(gains); i++) {
		ret = iio_gts_total_gain_to_scale(gts, gains[i],
						  &expected[2 * i],
						  &expected[2 * i + 1]);
		KUNIT_EXPECT_EQ(test, 0, ret);
		if (ret)
			return;
	}

	for (i = 0; i < ARRAY_SIZE(expected); i++)
		KUNIT_EXPECT_EQ(test, expected[i], vals[i]);
}

static void test_iio_gts_avail_test(struct kunit *test)
{
	struct device *dev;
	int ret;
	int type, len;
	const int *vals;

	dev = test_init_iio_gain_scale(test, &gts);
	if (!dev)
		return;

	/* test table building for times and iio_gts_avail_times() */
	ret = iio_gts_avail_times(&gts, &vals, &type, &len);
	KUNIT_EXPECT_EQ(test, IIO_AVAIL_LIST, ret);
	if (ret)
		return;

	KUNIT_EXPECT_EQ(test, IIO_VAL_INT_PLUS_MICRO, type);
	KUNIT_EXPECT_EQ(test, 8, len);
	if (len < 8)
		return;

	test_iio_gts_chk_times(test, vals);

	/* Test table building for all scales and iio_gts_all_avail_scales() */
	ret = iio_gts_all_avail_scales(&gts, &vals, &type, &len);
	KUNIT_EXPECT_EQ(test, IIO_AVAIL_LIST, ret);
	if (ret)
		return;

	KUNIT_EXPECT_EQ(test, IIO_VAL_INT_PLUS_NANO, type);

	test_iio_gts_chk_scales_all(test, &gts, vals, len);

	/*
	 * Test table building for scales/time and
	 * iio_gts_avail_scales_for_time()
	 */
	ret = iio_gts_avail_scales_for_time(&gts, 200000, &vals, &type, &len);
	KUNIT_EXPECT_EQ(test, IIO_AVAIL_LIST, ret);
	if (ret)
		return;

	KUNIT_EXPECT_EQ(test, IIO_VAL_INT_PLUS_NANO, type);
	test_iio_gts_chk_scales_t200(test, &gts, vals, len);
}

static struct kunit_case iio_gts_test_cases[] = {
	KUNIT_CASE(test_init_iio_gts_invalid),
	KUNIT_CASE(test_iio_gts_find_gain_for_scale_using_time),
	KUNIT_CASE(test_iio_gts_find_new_gain_sel_by_old_gain_time),
	KUNIT_CASE(test_iio_find_closest_gain_low),
	KUNIT_CASE(test_iio_gts_total_gain_to_scale),
	KUNIT_CASE(test_iio_gts_avail_test),
	{}
};

static struct kunit_suite iio_gts_test_suite = {
	.name = "iio-gain-time-scale",
	.test_cases = iio_gts_test_cases,
};

kunit_test_suite(iio_gts_test_suite);

MODULE_LICENSE("GPL");
MODULE_AUTHOR("Matti Vaittinen <mazziesaccount@gmail.com>");
MODULE_DESCRIPTION("Test IIO light sensor gain-time-scale helpers");
MODULE_IMPORT_NS(IIO_GTS_HELPER);